Precise prediction of optical behaviour of mechanically stressed edge emitting GaAs devices

Abstract The presence of a thermally annealed metallization layer on top GaAs slab waveguide proofed to be strong impact the optical device behavior. Induced by stress chip elasto-optical effect imprinted variation refractive index that led anti-guiding and guiding effects. In order enable precise prediction behavior we present 3D mechanical simulation which provides detailed insights overall state. results are then used in 2D in-house developed allows analysis microscopic Therefore, accumulated effects represented an effective temperature difference between semiconductor metallization, simplification model setup. validated comparison experimental derived data. As proves highly accurate, load can calculated vice versa from